Scan Mode When to use the Exhaustive Stack Focus Method
Scan Mode

Information in this article applies to:

  • uScope Navigator V4.0 and Later

Article ID: NSC1088 — Created: 9 Nov 2017 — Reviewed: 5 Apr 2018


When should I choose the Exhaustive Stack focus method to scan my slide?


The Exhaustive Stack focus method captures a deep stack (Z stack) of images for each field in the region of interest and chooses the one with the best focus. The best focus is determined by calculating which field has the highest contrast. Generally, objects in better-focused images have sharper edges which, in turn, have greater contrast.

This focus method should be used when the absolute best focus for each field is critical. It is the slowest focus method since it captures many images of each field in an effort to determine the best focus.

You can adjust the range and step settings for various aspects of exhaustive focus stacks in the device settings. Altering these settings may yield better results depending on the specimen and preparation.

Refer to Exhaustive Stack Focus Device Settings for more information about the Exhaustive Stack focus method settings.

Rate This Article
Contact Microscopes International or speak with your local distributor.
Copyright © 2024 Microscopes International, LLC. All rights reserved.