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Article ID: NSC1090 — Created: 9 Nov 2017 — Reviewed: 5 Apr 2018
When should I choose the Fast Stack focus method to scan my slide?
The Fast Stack focus method is similar to the Initial Focus method. It captures a very short stack (Z stack) of images for each field (centered on the initial focus point) and chooses the one with the best focus. This focus method is best used for professionally prepared specimens that are very thin and flat. You can adjust the parameters for the image stack to best suit your specimen.
Scanning slides using this focus method is slower than the Predictive Focus method but faster than the Exhaustive Stack method. If your specimen is very thin, this focus method may be the best choice for your scans.
You can set the range and step size for fast stacks in the device settings. Altering these settings may yield better results depending on the specimen and preparation.
Refer to Fast Stack Focus Device Settings for more information about the Fast Stack focus method settings.
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